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drm/ttm/tests: Add eviction testing
Add tests for ttm_bo_validate that focus on BO eviction and swapout. Update device funcs definition with eviction-related callbacks. Add alternative funcs where evict_flags() routes eviction to a domain that can't allocate resources (dubbed "busy manager" in the tests). Extract the common path of ttm_device init into a function. Signed-off-by: Karolina Stolarek <karolina.stolarek@intel.com> Reviewed-by: Somalapuram, Amaranath <asomalap@amd.com> Tested-by: Somalapuram, Amaranath <asomalap@amd.com> Signed-off-by: Arunpravin Paneer Selvam <Arunpravin.PaneerSelvam@amd.com> Link: https://patchwork.freedesktop.org/patch/msgid/ae8e284d6c7e6bd0be259052bd4f42e07ce24641.1718192625.git.karolina.stolarek@intel.com
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committed by
Arunpravin Paneer Selvam
parent
8eda41dfc9
commit
5fe3943385
@@ -13,7 +13,11 @@
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#include <drm/drm_kunit_helpers.h>
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#include <kunit/test.h>
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#define TTM_PL_MOCK1 (TTM_PL_PRIV + 1)
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#define TTM_PL_MOCK2 (TTM_PL_PRIV + 2)
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extern struct ttm_device_funcs ttm_dev_funcs;
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extern struct ttm_device_funcs ttm_dev_funcs_bad_evict;
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struct ttm_test_devices {
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struct drm_device *drm;
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@@ -26,6 +30,10 @@ int ttm_device_kunit_init(struct ttm_test_devices *priv,
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struct ttm_device *ttm,
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bool use_dma_alloc,
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bool use_dma32);
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int ttm_device_kunit_init_bad_evict(struct ttm_test_devices *priv,
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struct ttm_device *ttm,
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bool use_dma_alloc,
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bool use_dma32);
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struct ttm_buffer_object *ttm_bo_kunit_init(struct kunit *test,
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struct ttm_test_devices *devs,
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size_t size,
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