Commit 2a887191 authored by Joe Perches's avatar Joe Perches Committed by David S. Miller
Browse files

[E1000E]: convert register test macros to functions 



Add functions for reg_pattern_test and reg_set_and check
Changed macros to use these functions

Compiled x86, untested

Size decreased ~2K

old:

$ size drivers/net/e1000e/ethtool.o
   text    data     bss     dec     hex filename
  14461       0       0   14461    387d drivers/net/e1000e/ethtool.o

new:

$ size drivers/net/e1000e/ethtool.o
   text    data     bss     dec     hex filename
  12498       0       0   12498    30d2 drivers/net/e1000e/ethtool.o

Signed-off-by: default avatarJoe Perches <joe@perches.com>
Signed-off-by: default avatarAuke Kok <auke-jan.h.kok@intel.com>
Signed-off-by: default avatarDavid S. Miller <davem@davemloft.net>
parent 7e64300a

drivers/net/e1000e/ethtool.c

+53 −31
Original line number Diff line number Diff line
@@ -690,40 +690,62 @@ static int e1000_set_ringparam(struct net_device *netdev, 
	return err;

}



#define REG_PATTERN_TEST(R, M, W) REG_PATTERN_TEST_ARRAY(R, 0, M, W)

#define REG_PATTERN_TEST_ARRAY(reg, offset, mask, writeable)		      \

{									      \

	u32 _pat;							      \

	u32 _value;							      \

	u32 _test[] = {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};	      \

	for (_pat = 0; _pat < ARRAY_SIZE(_test); _pat++) {		      \

		E1000_WRITE_REG_ARRAY(hw, reg, offset,	      \

				      (_test[_pat] & writeable));	      \

		_value = E1000_READ_REG_ARRAY(hw, reg, offset);     \

		if (_value != (_test[_pat] & writeable & mask)) {	      \

			ndev_err(netdev, "pattern test reg %04X "             \

				 "failed: got 0x%08X expected 0x%08X\n",      \

				 reg + offset,  \

				 value, (_test[_pat] & writeable & mask));    \

			*data = reg;					      \

bool reg_pattern_test_array(struct e1000_adapter *adapter, u64 *data,

			    int reg, int offset, u32 mask, u32 write)

{

	int i;

	u32 read;

	static const u32 test[] =

		{0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};

	for (i = 0; i < ARRAY_SIZE(test); i++) {

		E1000_WRITE_REG_ARRAY(&adapter->hw, reg, offset,

				      (test[i] & write));

		read = E1000_READ_REG_ARRAY(&adapter->hw, reg, offset);

		if (read != (test[i] & write & mask)) {

			ndev_err(adapter->netdev, "pattern test reg %04X "

				 "failed: got 0x%08X expected 0x%08X\n",

				 reg + offset,

				 read, (test[i] & write & mask));

			*data = reg;

			return true;

		}

	}

	return false;

}



static bool reg_set_and_check(struct e1000_adapter *adapter, u64 *data,

			      int reg, u32 mask, u32 write)

{

	u32 read;

	__ew32(&adapter->hw, reg, write & mask);

	read = __er32(&adapter->hw, reg);

	if ((write & mask) != (read & mask)) {

		ndev_err(adapter->netdev, "set/check reg %04X test failed: "

			 "got 0x%08X expected 0x%08X\n", reg, (read & mask),

			 (write & mask));

		*data = reg;

		return true;

	}

	return false;

}



#define REG_PATTERN_TEST(R, M, W) \

	do { \

		if (reg_pattern_test_array(adapter, data, R, 0, M, W)) \

			return 1; \

		}							      \

	}								      \

}

	} while (0)



#define REG_PATTERN_TEST_ARRAY(R, offset, M, W) \

	do { \

		if (reg_pattern_test_array(adapter, data, R, offset, M, W)) \

			return 1; \

	} while (0)



#define REG_SET_AND_CHECK(R, M, W) \

{									      \

	u32 _value;							      \

	__ew32(hw, R, W & M);						\

	_value = __er32(hw, R);						\

	if ((W & M) != (_value & M)) {					      \

		ndev_err(netdev, "set/check reg %04X test failed: "           \

			 "got 0x%08X expected 0x%08X\n", R, (_value & M),     \

			 (W & M));					      \

		*data = R;						      \

	do { \

		if (reg_set_and_check(adapter, data, R, M, W)) \

			return 1; \

	}								      \

}

	} while (0)



static int e1000_reg_test(struct e1000_adapter *adapter, u64 *data)

{